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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Researchers developed an AI model to detect myocardial ischemia and coronary microvascular and vasomotor dysfunction using ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
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